Reduction of dark current in AlGaN/GaN Schottky barrier photodetectors with a low-temperature-grown GaN cap layer

G. C. Chi, J. K. Sheu, M. L. Lee, C. J. Kao, Y. K. Su, S. J. Chang, W. C. Lai

Research output: Contribution to journalConference article

Abstract

AlGaN/GaN-based ultraviolet (UV) Schottky barrier photodetectors (PDs) with and without the LT GaN cap layer were both fabricated. It was found that we could achieve a lower leakage current from sample A. With incident light wavelength of 320 nm and a -1 V reverse bias, the measured responsivity was around 0.03 A/W and 0.015 A/W for samples with and without the LT GaN cap layer, respectively. The response speed of the sample A was also found to be faster.

Original languageEnglish
Pages (from-to)353-358
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume798
Publication statusPublished - 2003 Dec 1
EventGaN and Related Alloys - 2003 - Boston, MA, United States
Duration: 2003 Dec 12003 Dec 5

Fingerprint

Dark currents
Photodetectors
dark current
caps
Leakage currents
photometers
Wavelength
Temperature
leakage
wavelengths
aluminum gallium nitride

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

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title = "Reduction of dark current in AlGaN/GaN Schottky barrier photodetectors with a low-temperature-grown GaN cap layer",
abstract = "AlGaN/GaN-based ultraviolet (UV) Schottky barrier photodetectors (PDs) with and without the LT GaN cap layer were both fabricated. It was found that we could achieve a lower leakage current from sample A. With incident light wavelength of 320 nm and a -1 V reverse bias, the measured responsivity was around 0.03 A/W and 0.015 A/W for samples with and without the LT GaN cap layer, respectively. The response speed of the sample A was also found to be faster.",
author = "Chi, {G. C.} and Sheu, {J. K.} and Lee, {M. L.} and Kao, {C. J.} and Su, {Y. K.} and Chang, {S. J.} and Lai, {W. C.}",
year = "2003",
month = "12",
day = "1",
language = "English",
volume = "798",
pages = "353--358",
journal = "Materials Research Society Symposium - Proceedings",
issn = "0272-9172",
publisher = "Materials Research Society",

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Reduction of dark current in AlGaN/GaN Schottky barrier photodetectors with a low-temperature-grown GaN cap layer. / Chi, G. C.; Sheu, J. K.; Lee, M. L.; Kao, C. J.; Su, Y. K.; Chang, S. J.; Lai, W. C.

In: Materials Research Society Symposium - Proceedings, Vol. 798, 01.12.2003, p. 353-358.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Reduction of dark current in AlGaN/GaN Schottky barrier photodetectors with a low-temperature-grown GaN cap layer

AU - Chi, G. C.

AU - Sheu, J. K.

AU - Lee, M. L.

AU - Kao, C. J.

AU - Su, Y. K.

AU - Chang, S. J.

AU - Lai, W. C.

PY - 2003/12/1

Y1 - 2003/12/1

N2 - AlGaN/GaN-based ultraviolet (UV) Schottky barrier photodetectors (PDs) with and without the LT GaN cap layer were both fabricated. It was found that we could achieve a lower leakage current from sample A. With incident light wavelength of 320 nm and a -1 V reverse bias, the measured responsivity was around 0.03 A/W and 0.015 A/W for samples with and without the LT GaN cap layer, respectively. The response speed of the sample A was also found to be faster.

AB - AlGaN/GaN-based ultraviolet (UV) Schottky barrier photodetectors (PDs) with and without the LT GaN cap layer were both fabricated. It was found that we could achieve a lower leakage current from sample A. With incident light wavelength of 320 nm and a -1 V reverse bias, the measured responsivity was around 0.03 A/W and 0.015 A/W for samples with and without the LT GaN cap layer, respectively. The response speed of the sample A was also found to be faster.

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M3 - Conference article

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EP - 358

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