Refinement of kernel and functional mechanisms for automatic virtual metrology system

  • Min Hsiung Hung
  • , Chun Fang Chen
  • , Yu Chuan Lin
  • , Ming Yi Chou
  • , Fan Tien Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Virtual Metrology (VM) refers to a technology that is able to conjecture product quality using important parameter data of production equipment and proper prediction schemes. In an automatic VM system (AVMS), VM Manager is the core of system's operations and the communication bridge among subsystems because it is responsible for distributing commands to each subsystem and possessing access privilege to the central database. This paper aims to develop a new kernel and several functional mechanisms for VM Manager so that the AVMS with refined VM Manager can have superior overall execution efficiency than the original one. A paradigm AVMS with the refined VM Manager for the TFT-LCD industry is constructed and tested. Integrated testing results validate that the developed new kernel and functional mechanisms of VM Manager can indeed achieve the design objectives.

Original languageEnglish
Title of host publicationAIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest
Pages472-477
Number of pages6
DOIs
Publication statusPublished - 2012
Event2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2012 - Kaohsiung, Taiwan
Duration: 2012 Jul 112012 Jul 14

Publication series

NameIEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

Other

Other2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2012
Country/TerritoryTaiwan
CityKaohsiung
Period12-07-1112-07-14

All Science Journal Classification (ASJC) codes

  • Software
  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Computer Science Applications

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