TY - GEN
T1 - Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators
AU - Hsu, Shu Han
AU - Yang, Kexin
AU - Milor, Linda
N1 - Funding Information:
ACKNOWLEDGMENTS The authors would like to gratefully acknowledge Dr. Yi-Da Wu and Li-Hsiang Lin for their helpful discussions. The authors would like to thank the NSF for support under Award Number 1700914.
Publisher Copyright:
© 2019 IEEE.
PY - 2019/11
Y1 - 2019/11
N2 - Accelerated lifetime tests are necessary for reliability evaluation of circuits and systems, but the parameters for choosing the test conditions are often unknown. Furthermore, reliability testing is generally performed on test structures that have different properties than actual circuits and systems, which may create inconsistencies in how circuits and systems work in reality. To combat this problem, we use ring oscillators, which are similar to circuits, based on the 14nm FinFET node as the circuit vehicle to extract wearout data. We explore the effects of testing time, sample size, and number of stages on the ability to detect failures for various test conditions, focusing on front-end time dependent dielectric breakdown, which is one of the most dominant wearout mechanisms.
AB - Accelerated lifetime tests are necessary for reliability evaluation of circuits and systems, but the parameters for choosing the test conditions are often unknown. Furthermore, reliability testing is generally performed on test structures that have different properties than actual circuits and systems, which may create inconsistencies in how circuits and systems work in reality. To combat this problem, we use ring oscillators, which are similar to circuits, based on the 14nm FinFET node as the circuit vehicle to extract wearout data. We explore the effects of testing time, sample size, and number of stages on the ability to detect failures for various test conditions, focusing on front-end time dependent dielectric breakdown, which is one of the most dominant wearout mechanisms.
UR - https://www.scopus.com/pages/publications/85078923892
UR - https://www.scopus.com/pages/publications/85078923892#tab=citedBy
U2 - 10.1109/DCIS201949030.2019.8959834
DO - 10.1109/DCIS201949030.2019.8959834
M3 - Conference contribution
AN - SCOPUS:85078923892
T3 - 2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019
BT - 2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019
Y2 - 20 November 2019 through 22 November 2019
ER -