Reliability characteristics of Hebbian-type associative memories in network implementations

Pau Choo Chung, Thomas F. Krile

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The performance of Hebbian-type associative memories (HAMs) in the presence of faulty interconnections is examined, and equations for predicting network reliability are developed. Optical and VLSI implementations of HAMs are introduced, and the distributions of faulty interconnections in both implementations are discussed. The interconnection faults considered are the equivalent of open-circuit and short-circuit synaptic interconnections. Equations relating the probability of direct one-step convergence (Pdc) to the percentage of failed interconnections are developed for both types of interconnection faults. Monte Carlo simulations indicate that the equations considered here can estimate Pdc accurately. Based on the equations, network performance with failed interconnections can be predicted and trade-offs in network design can be determined before proceeding to implementation. The performance of networks with clustered failed interconnections is also discussed and compared with that of networks with randomly distributed faults. The present results are discussed from the implementation point of view.

Original languageEnglish
Title of host publicationProceedings. IJCNN - International Joint Conference on Neural Networks
Editors Anon
PublisherPubl by IEEE
Pages363-368
Number of pages6
ISBN (Print)0780301641
Publication statusPublished - 1992 Jan 1
EventInternational Joint Conference on Neural Networks - IJCNN-91-Seattle - Seattle, WA, USA
Duration: 1991 Jul 81991 Jul 12

Publication series

NameProceedings. IJCNN - International Joint Conference on Neural Networks

Other

OtherInternational Joint Conference on Neural Networks - IJCNN-91-Seattle
CitySeattle, WA, USA
Period91-07-0891-07-12

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Chung, P. C., & Krile, T. F. (1992). Reliability characteristics of Hebbian-type associative memories in network implementations. In Anon (Ed.), Proceedings. IJCNN - International Joint Conference on Neural Networks (pp. 363-368). (Proceedings. IJCNN - International Joint Conference on Neural Networks). Publ by IEEE.