Reliability mechanisms of LTPS-TFT with HfO2 gate dielectric: PBTI, NBTI, and hot-carrier stress

Ming Wen Ma, Chi Yang Chen, Woei Cheng Wu, Chun Jung Su, Kuo Hsing Kao, Tien Sheng Chao, Tan Fu Lei

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds