Reliability prediction of imperfect switching systems under Gamma distribution

J. N. Pan, S. W. Sun

Research output: Contribution to journalArticle

Abstract

Reliability Prediction plays a very important role in system design, and the two key factors considered in predicting system reliability are: failure distribution of the component/equipment and system configuration. This paper conducts reliability estimation and comparison on different imperfect systems with components, switch and sensor under different failure rate and various intended periods of use. The results can provide guidelines of decision making for system design in industries.

Original languageEnglish
Pages (from-to)169-180
Number of pages12
JournalKung Yeh Kung Chieng Hsueh K'an/Journal of the Chinese Institute of Industrial Engineers
Volume14
Issue number2
DOIs
Publication statusPublished - 1997 Jan 1

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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