Reliability prediction of imperfect switching systems under Gamma distribution

J. N. Pan; S. W. Sun

doi:10.1080/10170669.1997.10433381

Reliability prediction of imperfect switching systems under Gamma distribution

J. N. Pan, S. W. Sun

Department of Statistics

Research output: Contribution to journal › Article › peer-review

Abstract

Reliability Prediction plays a very important role in system design, and the two key factors considered in predicting system reliability are: failure distribution of the component/equipment and system configuration. This paper conducts reliability estimation and comparison on different imperfect systems with components, switch and sensor under different failure rate and various intended periods of use. The results can provide guidelines of decision making for system design in industries.

Original language	English
Pages (from-to)	169-180
Number of pages	12
Journal	Kung Yeh Kung Chieng Hsueh K'an/Journal of the Chinese Institute of Industrial Engineers
Volume	14
Issue number	2
DOIs	https://doi.org/10.1080/10170669.1997.10433381
Publication status	Published - 1997 Jan 1

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering

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10.1080/10170669.1997.10433381

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Reliability prediction of imperfect switching systems under Gamma distribution

Abstract

All Science Journal Classification (ASJC) codes

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