Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

E. Strelcov, Y. Kim, J. C. Yang, Y. H. Chu, P. Yu, X. Lu, S. Jesse, S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

46 Citations (Scopus)

Abstract

The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V ac is a necessary step to establish the veracity of PFM hysteresis measurements.

Original languageEnglish
Article number192902
JournalApplied Physics Letters
Volume101
Issue number19
DOIs
Publication statusPublished - 2012 Nov 5

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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