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Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

  • E. Strelcov
  • , Y. Kim
  • , J. C. Yang
  • , Y. H. Chu
  • , P. Yu
  • , X. Lu
  • , S. Jesse
  • , S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

Abstract

The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V ac is a necessary step to establish the veracity of PFM hysteresis measurements.

Original languageEnglish
Article number192902
JournalApplied Physics Letters
Volume101
Issue number19
DOIs
Publication statusPublished - 2012 Nov 5

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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