@inproceedings{53e062dc6e7a4008ab894b20f4309dbe,
title = "Scan design for asynchronous sequential logic circuits using SR-latches",
abstract = "This paper presents a scan design for asynchronous sequential logic circuits (ASLCs) using modified SR-latches. With this scan structure, an ASLC is operated in an asynchronous way during the normal operation mode, while it is synchronized with clock signals during the test mode. The modified SR-latch is free of hazards and races for both fault-free and faulty circuits and the scan structure is race-free during normal operation and test modes. The structure achieves full testability of all single stuck-at faults.",
author = "Ming-Der Shieh and Wey, \{Chin Long\} and Fisher, \{P. David\}",
year = "1993",
month = dec,
day = "1",
language = "English",
isbn = "0780317610",
series = "Midwest Symposium on Circuits and Systems",
publisher = "Publ by IEEE",
pages = "1300--1303",
booktitle = "Midwest Symposium on Circuits and Systems",
note = "Proceedings of the 36th Midwest Symposium on Circuits and Systems ; Conference date: 16-08-1993 Through 18-08-1993",
}