Scattering lifetimes due to interface roughness with large lateral correlation length in (formula presented) two-dimensional electron gas

H. Tang, J. B. Webb, P. Coleridge, J. A. Bardwell, C. H. Ko, Y. K. Su, S. J. Chang

Research output: Contribution to journalArticlepeer-review

Abstract

(formula presented) two-dimensional electron gas structures have been grown by molecular-beam epitaxy and exhibited surface roughness defined by the faceted surface morphology of the crystal grains or subgrains, with the grain size being the obvious lateral periodicity. The roughness amplitude varied in a wide range depending on the substrate type and growth conditions. The effect of interface roughness with lateral correlation length of the order of the grain sizes (0.1-1 µm) on the scattering lifetimes is calculated theoretically and compared with experimentally observed lifetime values. We conclude that scattering by long-range interface roughness has little impact on the transport lifetime, but competes with other scattering mechanisms to be the dominant source of small-angle scattering that limits the quantum scattering lifetime.

Original languageEnglish
Pages (from-to)1-7
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume66
Issue number24
DOIs
Publication statusPublished - 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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