The interfacial characteristics of a series of oxide films on GaAs were investigated using photoreflectance (PR) and Raman spectra. The barrier heights across the interfaces and the densities of interfacial states were determined from the PR intensity as a function of the pump power density. Raman spectra were used to characterize the structural properties of the oxide films.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)