Abstract
The authors propose an easy and cost-effective meth-od for improving the reliability of see-through tandem modules. By adding hardener to the conventional see-through tandem modules, it was found that we could enhance the 1000-h-damp-heat-test degradation ratio from 82.64% to 89.6%, a near 7% enhancement. It was also found that the efficiency degraded only by 6.0% for the see-through tandem modules with hardener, after six IEC cycles. The smaller degradation ratio indicates that the see-through tandem modules with hardener were more reliable, as compared with the non-see-through tandem modules.
| Original language | English |
|---|---|
| Article number | 6802338 |
| Pages (from-to) | 1013-1017 |
| Number of pages | 5 |
| Journal | IEEE Journal of Photovoltaics |
| Volume | 4 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2014 Jul |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering