An alternative method to compute Seidel aberrations is presented that utilizes real pseudoparaxial skew rays traveling through a rotationally-symmetric lens system as a Taylor series expansion in terms of object height and ray-direction spherical coordinates. Expressions for defocus, lateral magnification, and Seidel primary ray aberration coefficients are obtained in terms of numerically-determined higher-order partial derivatives of rays which are proximate to the optical axis. In contrast to commonly used methods, the new form of the aberration coefficients is related to unit entrance pupil radius and unit object height. The proposed methodology can be extended to derive higher-order ray aberration coefficients.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics