Sensing and determination of contact potential difference between two metals using an actuating capacitor

C. K. Chung, W. T. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this article, measurement of contact potential difference (CPD) between two dissimilar metals or alloys has been investigated by an actuating capacitor attached to a low cost home-made Kelvin probe system. The detailed sensing mechanism and analysis of the output signals for the CPD determination have been proposed. The resolution can reach 0.01 eV with three scientific digitals which is potentially used for the high-resolution measurement of non-contact mechanical, electrical properties and material science in a micro-domain phenomenon at low cost. A pure Ni probe was fabricated to measure the CPD of the electrodeposited Ni film and used as calibration data. The effect of Co atomic concentration on CPD of the electrodeposited Ni-Co alloys was studied for extending future application.

Original languageEnglish
Title of host publication3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008
Pages215-218
Number of pages4
DOIs
Publication statusPublished - 2008 Sep 1
Event3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008 - Sanya, China
Duration: 2008 Jan 62008 Jan 9

Publication series

Name3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS

Other

Other3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008
CountryChina
CitySanya
Period08-01-0608-01-09

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Chung, C. K., & Chang, W. T. (2008). Sensing and determination of contact potential difference between two metals using an actuating capacitor. In 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008 (pp. 215-218). [4484321] (3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS). https://doi.org/10.1109/NEMS.2008.4484321