This paper presents the design and analysis of a single-compound complementary split-ring resonator (SC-CSRR) that induces two resonance frequencies for simultaneously measuring the thickness and permittivity of dual-layer dielectric structures. Two resonance frequencies were generated using two distinct embedded resonator current lengths in a single complementary split-ring resonator. These two resonance frequency responses were combined to determine the thickness and permittivity of a dual-layer dielectric sample. Methods proposed in this paper were used to analyze the equivalent permittivity relationship, and thus, determine the thickness and permittivity of the material under test. The proposed simple low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was experimentally analyzed and verified in experiments. The experimental results indicated that the average thickness and permittivity measurement errors were 6.26% and 4.63%, respectively, for single-layer samples, and 5.26% and 6.48%, respectively, for dual-layer samples.
|Number of pages||14|
|Journal||IEEE Transactions on Microwave Theory and Techniques|
|Publication status||Published - 2015 Jun 1|
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering