TY - GEN
T1 - Single compound complementary split-ring resonator for simultaneously measuring permittivity and thickness
AU - Lee, Chieh Sen
AU - Yang, Chin Lung
PY - 2014/1/1
Y1 - 2014/1/1
N2 - This paper presents a single compound complementary split-ring (SC-CSRR) to induce dual resonance frequencies for simultaneously measuring the permittivity and thickness of a material. The dual resonance frequencies, fL and fH, are generated using two distinct resonator current lengths in a single CSRR. By using the proposed methods, the ratio of dual resonance frequency relationship can be used to determine the thickness of the material under test (MUT); the permittivity is linearly related to the resonance frequency. A simple and low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was numerically analyzed and experimentally verified. Testing yielded average measurement errors of 6.26% and 4.63% for the thickness and permittivity, respectively.
AB - This paper presents a single compound complementary split-ring (SC-CSRR) to induce dual resonance frequencies for simultaneously measuring the permittivity and thickness of a material. The dual resonance frequencies, fL and fH, are generated using two distinct resonator current lengths in a single CSRR. By using the proposed methods, the ratio of dual resonance frequency relationship can be used to determine the thickness of the material under test (MUT); the permittivity is linearly related to the resonance frequency. A simple and low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was numerically analyzed and experimentally verified. Testing yielded average measurement errors of 6.26% and 4.63% for the thickness and permittivity, respectively.
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U2 - 10.1109/MWSYM.2014.6848413
DO - 10.1109/MWSYM.2014.6848413
M3 - Conference contribution
AN - SCOPUS:84905014864
SN - 9781479938698
T3 - IEEE MTT-S International Microwave Symposium Digest
BT - 2014 IEEE MTT-S International Microwave Symposium, IMS 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE MTT-S International Microwave Symposium, IMS 2014
Y2 - 1 June 2014 through 6 June 2014
ER -