Single compound complementary split-ring resonator for simultaneously measuring permittivity and thickness

Chieh Sen Lee, Chin Lung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

This paper presents a single compound complementary split-ring (SC-CSRR) to induce dual resonance frequencies for simultaneously measuring the permittivity and thickness of a material. The dual resonance frequencies, fL and fH, are generated using two distinct resonator current lengths in a single CSRR. By using the proposed methods, the ratio of dual resonance frequency relationship can be used to determine the thickness of the material under test (MUT); the permittivity is linearly related to the resonance frequency. A simple and low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was numerically analyzed and experimentally verified. Testing yielded average measurement errors of 6.26% and 4.63% for the thickness and permittivity, respectively.

Original languageEnglish
Title of host publication2014 IEEE MTT-S International Microwave Symposium, IMS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479938698
DOIs
Publication statusPublished - 2014 Jan 1
Event2014 IEEE MTT-S International Microwave Symposium, IMS 2014 - Tampa, FL, United States
Duration: 2014 Jun 12014 Jun 6

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Other

Other2014 IEEE MTT-S International Microwave Symposium, IMS 2014
Country/TerritoryUnited States
CityTampa, FL
Period14-06-0114-06-06

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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