Single-nanopore investigations with ion conductance microscopy

Chiao-Chen Chen, Yi Zhou, Lane A. Baker

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single-nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multipore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.

Original languageEnglish
Pages (from-to)8404-8411
Number of pages8
JournalACS Nano
Volume5
Issue number10
DOIs
Publication statusPublished - 2011 Oct 25

Fingerprint

Nanopores
Microscopic examination
Ions
microscopy
Microscopes
microscopes
ions
Scanning
scanning
Electric potential
electric potential
membranes
Membranes
porosity
Painting
equivalent circuits
Equivalent circuits
Electrodes
electrodes
Geometry

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Chen, Chiao-Chen ; Zhou, Yi ; Baker, Lane A. / Single-nanopore investigations with ion conductance microscopy. In: ACS Nano. 2011 ; Vol. 5, No. 10. pp. 8404-8411.
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Single-nanopore investigations with ion conductance microscopy. / Chen, Chiao-Chen; Zhou, Yi; Baker, Lane A.

In: ACS Nano, Vol. 5, No. 10, 25.10.2011, p. 8404-8411.

Research output: Contribution to journalArticle

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