Single-nanopore investigations with ion conductance microscopy

Chiao Chen Chen, Yi Zhou, Lane A. Baker

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single-nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multipore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.

Original languageEnglish
Pages (from-to)8404-8411
Number of pages8
JournalACS Nano
Volume5
Issue number10
DOIs
Publication statusPublished - 2011 Oct 25

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

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