Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3

V. V. Chistyakov, A. N. Domozhirova, J. C.A. Huang, V. V. Marchenkov

Research output: Contribution to journalArticlepeer-review

Abstract

Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

Original languageEnglish
Pages (from-to)838-840
Number of pages3
JournalBulletin of the Russian Academy of Sciences: Physics
Volume83
Issue number7
DOIs
Publication statusPublished - 2019 Jul 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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