Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3

V. V. Chistyakov; A. N. Domozhirova; J. C.A. Huang; V. V. Marchenkov

doi:10.3103/S1062873819070116

Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi₂Se₃

V. V. Chistyakov
, A. N. Domozhirova
, J. C.A. Huang
, V. V. Marchenkov

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi₂Se₃ 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi₂Se₃ films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

Original language	English
Pages (from-to)	838-840
Number of pages	3
Journal	Bulletin of the Russian Academy of Sciences: Physics
Volume	83
Issue number	7
DOIs	https://doi.org/10.3103/S1062873819070116
Publication status	Published - 2019 Jul 1

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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@article{4ef8fcf0403a41ae91b84cff43e50c68,

title = "Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3 ",

abstract = "Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film{\textquoteright}s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.",

author = "Chistyakov, \{V. V.\} and Domozhirova, \{A. N.\} and Huang, \{J. C.A.\} and Marchenkov, \{V. V.\}",

note = "Publisher Copyright: {\textcopyright} 2019, Allerton Press, Inc.",

year = "2019",

month = jul,

day = "1",

doi = "10.3103/S1062873819070116",

language = "English",

volume = "83",

pages = "838--840",

journal = "Bulletin of the Russian Academy of Sciences: Physics",

issn = "1062-8738",

publisher = "Pleiades Publishing",

number = "7",

}

TY - JOUR

T1 - Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3

AU - Chistyakov, V. V.

AU - Domozhirova, A. N.

AU - Huang, J. C.A.

AU - Marchenkov, V. V.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

AB - Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

UR - https://www.scopus.com/pages/publications/85070819923

UR - https://www.scopus.com/pages/publications/85070819923#tab=citedBy

U2 - 10.3103/S1062873819070116

DO - 10.3103/S1062873819070116

M3 - Article

AN - SCOPUS:85070819923

SN - 1062-8738

VL - 83

SP - 838

EP - 840

JO - Bulletin of the Russian Academy of Sciences: Physics

JF - Bulletin of the Russian Academy of Sciences: Physics

IS - 7

ER -

Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi₂Se₃

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