Solid-phase reaction of tungsten thin films with polycrystalline diamond

A. Bachli, J. S. Chen, R. P. Ruiz, M. A. Nicolet

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)


The thermally induced solid-phase reaction of 135 nm thick sputter-deposited W films with polycrystalline CVD-grown diamond substrates is investigated. The samples are annealed in vacuum (5×10-7 torr) at temperatures between 700 °C and 1100 °C for 1 hour and examined by 2 MeV 4He++ backscattering spectrometry, x-ray diffraction, and scanning electron microscopy. The as-deposited W films contain roughly 5 at.% oxygen. After annealing the samples at 800 °C this oxygen concentration falls below the detection limit of less than 1%. Incipient W2C phase formation occurs during annealing at 900 °C. The final state, the WC phase, is reached after annealing at 1100 °C.

Original languageEnglish
Pages (from-to)247-252
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Publication statusPublished - 1994 Jan 1
EventProceedings of the 1994 MRS Spring Meeting - San Francisco, CA, USA
Duration: 1994 Apr 41994 Apr 8

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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