Some Degradation Measurements and Models on Nano Reliability

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	The 2007 Taipei International Statistical Symposium and ICSA International Conference
Place of Publication	Taipei, Taiwan
Publication status	Published - 2007 Jun 25

Cite this

@inproceedings{1403d3dd2c1b4beba3387c441d25a732,

title = "Some Degradation Measurements and Models on Nano Reliability",

author = "Shuen-Lin Jeng",

note = "Invited talk",

year = "2007",

month = jun,

day = "25",

language = "English",

booktitle = "The 2007 Taipei International Statistical Symposium and ICSA International Conference",

}