Space Charge and Resistance Effects on Saturation of Field Emission

Guo Ning Wang, Kaviya Aranganadin, Yung Chiang Lan, Hua Yi Hsu, John P. Verboncoeur, Ming Chieh Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.

Original languageEnglish
Title of host publication36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages72-73
Number of pages2
ISBN (Electronic)9798350301434
DOIs
Publication statusPublished - 2023
Event36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023 - Cambridge, United States
Duration: 2023 Jul 102023 Jul 13

Publication series

Name36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023

Conference

Conference36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
Country/TerritoryUnited States
CityCambridge
Period23-07-1023-07-13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

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