TY - GEN
T1 - Space Charge and Resistance Effects on Saturation of Field Emission
AU - Wang, Guo Ning
AU - Aranganadin, Kaviya
AU - Lan, Yung Chiang
AU - Hsu, Hua Yi
AU - Verboncoeur, John P.
AU - Lin, Ming Chieh
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.
AB - Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.
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U2 - 10.1109/IVNC57695.2023.10188956
DO - 10.1109/IVNC57695.2023.10188956
M3 - Conference contribution
AN - SCOPUS:85168668714
T3 - 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
SP - 72
EP - 73
BT - 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
Y2 - 10 July 2023 through 13 July 2023
ER -