Space-resolving VUV and soft X-ray spectroscopy in the tandem mirror gamma 10 plasma

M. Yoshikawa, Y. Okamoto, E. Kawamori, Y. Watanabe, C. Watabe, T. Furukawa, Y. Kubota, K. Sedo, T. Cho, K. Yatsu, N. Yamaguchi

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Vacuum ultraviolet (VUV) and soft X-ray (SX) spectroscopic measurements are important means to diagnose radiation power loss, impurity ion densities and effective charge of confined plasma, Zeff, in magnetically confined plasmas such as fusion plasmas. We have constructed space- and time-resolving flat-field VUV (150-1050 Å) and SX (20-350 Å) spectrographs by using aberration-corrected concave gratings with varied line spacing. Absolute calibration experiments have been conducted at the Photon Factory in the High Energy Accelerator Research Organization. Absolute sensitivities of the VUV and SX spectrographs have been obtained for the two (S and P) polarization geometries. Thus, absolute intensities of emission spectra from impurity ions can be measured together with their radial distributions in plasmas. The total radiation power was determined to be less than 6 kW within ±20% of error in our normal plasma operation. Density profiles of impurity ions were reduced by using absolute emissivities of impurity lines and a collisional-radiative model. Moreover, the value of Zeff is estimated to be 1.00 in the tandem mirror GAMMA 10 plasma.

Original languageEnglish
Pages (from-to)555-559
Number of pages5
JournalSurface Review and Letters
Volume9
Issue number1
DOIs
Publication statusPublished - 2002 Feb

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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