Special session: Hot topic design and test of 3D and emerging memories

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this hot topic session, we are including three talks that cover design of reliable, emerging memories, with emphasis on 3D memories, DRAM and non-volatile memories. We will also introduce a new class of memory, the Storage Class Memory (SCM), and discuss its reliability issues.

Original languageEnglish
Title of host publicationProceedings - 2011 29th IEEE VLSI Test Symposium, VTS 2011
Number of pages1
DOIs
Publication statusPublished - 2011 Jul 1
Event2011 29th IEEE VLSI Test Symposium, VTS 2011 - Dana Point, CA, United States
Duration: 2011 May 12011 May 5

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Conference

Conference2011 29th IEEE VLSI Test Symposium, VTS 2011
CountryUnited States
CityDana Point, CA
Period11-05-0111-05-05

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications

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