Spectral and spatial luminescence distribution of m-plane ZnO epitaxial films containing stacking faults: A cathodoluminescence study

Wan Hsien Lin, Uwe Jahn, Holger T. Grahn, Liuwen Chang, Mitch M.C. Chou, Jih Jen Wu

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11 Citations (Scopus)

Abstract

The luminescence of stacking faults (SFs) in m-plane ZnO epilayers grown by metal organic chemical vapor deposition is analyzed using spatially resolved cathodoluminescence (CL) spectroscopy. Complementary features observed in CL images for detection energies of 3.379 (near-bandedge) and 3.324 eV confirm the latter to be a typical SF-associated luminescence. A clear blue shift of the SF-associated luminescence is observed when the electron beam approaches the SF. This experimental result proves the existence of a polarization field in the SFs along the c-axis of the ZnO film. Furthermore, we clearly identify the SF-related transition at low temperatures and at room temperature.

Original languageEnglish
Article number061101
JournalApplied Physics Express
Volume6
Issue number6
DOIs
Publication statusPublished - 2013 Jun 1

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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