Abstract
The luminescence of stacking faults (SFs) in m-plane ZnO epilayers grown by metal organic chemical vapor deposition is analyzed using spatially resolved cathodoluminescence (CL) spectroscopy. Complementary features observed in CL images for detection energies of 3.379 (near-bandedge) and 3.324 eV confirm the latter to be a typical SF-associated luminescence. A clear blue shift of the SF-associated luminescence is observed when the electron beam approaches the SF. This experimental result proves the existence of a polarization field in the SFs along the c-axis of the ZnO film. Furthermore, we clearly identify the SF-related transition at low temperatures and at room temperature.
Original language | English |
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Article number | 061101 |
Journal | Applied Physics Express |
Volume | 6 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2013 Jun 1 |
All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)