Strain-driven phase boundaries in BiFeO 3 thin films studied by atomic force microscopy and x-ray diffraction

Heng Jui Liu, Chen Wei Liang, Wen I. Liang, Hsiang Jung Chen, Jan Chi Yang, Chun Yen Peng, Guang Fu Wang, Feng Nan Chu, Yi Chun Chen, Hsin Yi Lee, Li Chang, Su Jien Lin, Ying Hao Chu

Research output: Contribution to journalArticle

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Abstract

We report a detailed study on the strain-driven phase transition between the tetragonal-like and rhombohedral-like phases in epitaxial BiFeO 3 (BFO) thin films which focuses on their structural nature, thermodynamic stability, and ferroelectric/piezoelectric properties. We first show that the tetragonal-like phase, which has a large c/a ratio (∼1.2), in the compressively strained BFO is thermodynamically more favorable at high temperature and high strain state (small thickness). We also report a phase transition between two monoclinic phases at 150°C. The two monoclinic phases are differentiated by their c-axis parameters and tilting angles: The low-temperature phase (M C) has a c-axis parameter of 4.64 and a tilting angle (β = 88.5°) along the a axis, while the high-temperature phase (M A) has a c-axis parameter of 4.66 and a tilting angle (β = 86.8°) along both of the a and b axes. We further show that samples undergoing the M C-M A phase transition exhibit ferroelectric polarization rotation and piezoelectric enhancement. Our findings directly unveil the close links between structural changes, polarization rotation, and large piezoelectricity at morphotropic phase boundaries in BiFeO 3.

Original languageEnglish
Article number014104
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Issue number1
DOIs
Publication statusPublished - 2012 Jan 17

Fingerprint

Phase boundaries
Atomic force microscopy
x ray diffraction
Diffraction
Phase transitions
atomic force microscopy
X rays
Thin films
Ferroelectric materials
thin films
Polarization
Piezoelectricity
Temperature
Thermodynamic stability
piezoelectricity
polarization
thermodynamics
augmentation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Liu, Heng Jui ; Liang, Chen Wei ; Liang, Wen I. ; Chen, Hsiang Jung ; Yang, Jan Chi ; Peng, Chun Yen ; Wang, Guang Fu ; Chu, Feng Nan ; Chen, Yi Chun ; Lee, Hsin Yi ; Chang, Li ; Lin, Su Jien ; Chu, Ying Hao. / Strain-driven phase boundaries in BiFeO 3 thin films studied by atomic force microscopy and x-ray diffraction. In: Physical Review B - Condensed Matter and Materials Physics. 2012 ; Vol. 85, No. 1.
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Strain-driven phase boundaries in BiFeO 3 thin films studied by atomic force microscopy and x-ray diffraction. / Liu, Heng Jui; Liang, Chen Wei; Liang, Wen I.; Chen, Hsiang Jung; Yang, Jan Chi; Peng, Chun Yen; Wang, Guang Fu; Chu, Feng Nan; Chen, Yi Chun; Lee, Hsin Yi; Chang, Li; Lin, Su Jien; Chu, Ying Hao.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 85, No. 1, 014104, 17.01.2012.

Research output: Contribution to journalArticle

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AU - Liu, Heng Jui

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AU - Yang, Jan Chi

AU - Peng, Chun Yen

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AU - Chu, Feng Nan

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AU - Lee, Hsin Yi

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AU - Lin, Su Jien

AU - Chu, Ying Hao

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