Strain effects on the ferromagnetic and electronic properties in (La 0.91,Sr0.09)MnO3 thin films

Yen Hua Chen, Tai Bor Wu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

La1-x Srx Mn O3 (LSMO) thin films with a polycrystalline structure of variable thickness were deposited by a radio-frequency magnetron sputtering system on Si O2 (200 nm) Si (100) substrate. The ferromagnetic property and electrical transport increased with increasing film thickness. This can be considered as the result of small deformation of the Mn-O bond length/bond angle due to the relaxation of tensile strain, which enhances the ferromagnetotransport properties. Additionally, there is an oxide layer found at the interface between the film and substrate from the transmission electron microscopy observation. It is also exhibited by conductive atomic force microscopy measurement that the metallic and insulative regions are coexisted in all of the films.

Original languageEnglish
Pages (from-to)29-32
Number of pages4
JournalElectrochemical and Solid-State Letters
Volume10
Issue number5
DOIs
Publication statusPublished - 2007 Mar 23

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Strain effects on the ferromagnetic and electronic properties in (La <sub>0.91</sub>,Sr<sub>0.09</sub>)MnO<sub>3</sub> thin films'. Together they form a unique fingerprint.

  • Cite this