Strain Evolution in Coherent Ge/Si Islands

Chuan Pu Liu, J. Murray David, David G. Cahill, Theodore I. Kamins, David P. Basile, R. Stanley Williams

Research output: Contribution to journalArticlepeer-review

83 Citations (Scopus)


Strain evolution of coherent Ge islands on Si(001) is measured using a newly developed transmission electron microscopy technique based on two-beam dark-field strain imaging. The strain measurements show that a metastable Ge island shape is involved in the shape transition between pyramids and domes; this shape is more readily observed for growth at 550 than 600°C because of the slower rate at which islands cross the kinetic barrier between shapes. The strain relaxation changes discontinuously between pyramids and domes, indicating that the underlying shape transition is first order.

Original languageEnglish
Pages (from-to)1958-1961
Number of pages4
JournalPhysical review letters
Issue number9
Publication statusPublished - 2000 Feb 28

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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