Abstract
A strain transfer process between two epitaxial thin films with different lattice constants will be discussed. It is demonstrated that an epitaxial film (epifilm) grown on top of a thin buffer layer may release the strain to the buffer layer, leaving the epifilm dislocation free. A criterion to achieve this strain transfer is also derived. The strain transfer model can explain recent experiments on the growth of low dislocation relaxed SiGe material on Si. For GaAs-based materials we propose a scheme to form a thin buffer by GaAs situated on top of a buried oxide such as Al2O3through wet oxidation of AlAs. This GaAs thin buffer provides a flexible substrate for the growth of epifilms with thicknesses not limited by conventional critical thickness for strained layers. Detailed numerical analysis on the growth of InxGa1-xAs on GaAs is also performed.
| Original language | English |
|---|---|
| Pages (from-to) | 231-237 |
| Number of pages | 7 |
| Journal | Philosophical Magazine Letters |
| Volume | 72 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1995 Oct |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics