Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy

Y. H. Liou, W. F. Pong, M. H. Tsai, K. H. Chang, H. H. Hseih, Y. K. Chang, F. Z. Chien, P. K. Tseng, J. F. Lee, Y. Liou, J. C. Huang

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Abstract

We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11̄00) (40 Å)/Cr(211) (tCr) (tCr = 2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results.

Original languageEnglish
Pages (from-to)9616-9620
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume62
Issue number14
DOIs
Publication statusPublished - 2000 Oct 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Liou, Y. H., Pong, W. F., Tsai, M. H., Chang, K. H., Hseih, H. H., Chang, Y. K., Chien, F. Z., Tseng, P. K., Lee, J. F., Liou, Y., & Huang, J. C. (2000). Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy. Physical Review B - Condensed Matter and Materials Physics, 62(14), 9616-9620. https://doi.org/10.1103/PhysRevB.62.9616