Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

Yu-chun Wu; S. Parola; O. Marty; M. Villanueva-Ibanez; J. Mugnier

doi:10.1016/j.optmat.2005.03.004

Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

Yu-chun Wu, S. Parola, O. Marty, M. Villanueva-Ibanez, J. Mugnier

Department of Resources Engineering

Research output: Contribution to journal › Conference article › peer-review

33 Citations (Scopus)

Abstract

Y₃Al₅O₁₂ (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

Original language	English
Pages (from-to)	1471-1479
Number of pages	9
Journal	Optical Materials
Volume	27
Issue number	9
DOIs	https://doi.org/10.1016/j.optmat.2005.03.004
Publication status	Published - 2005 Jan 1
Event	Proceedings of the Third International Conference on Sol-Gel Materials: Research, Technology, Applications SGM '04 - Duration: 2004 Jun 6 → 2004 Jun 11

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Computer Science(all)
Atomic and Molecular Physics, and Optics
Spectroscopy
Physical and Theoretical Chemistry
Organic Chemistry
Inorganic Chemistry
Electrical and Electronic Engineering

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title = "Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes",

abstract = "Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.",

author = "Yu-chun Wu and S. Parola and O. Marty and M. Villanueva-Ibanez and J. Mugnier",

year = "2005",

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T1 - Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

AU - Wu, Yu-chun

AU - Parola, S.

AU - Marty, O.

AU - Villanueva-Ibanez, M.

AU - Mugnier, J.

PY - 2005/1/1

Y1 - 2005/1/1

N2 - Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

AB - Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

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