Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

Yu-chun Wu, S. Parola, O. Marty, M. Villanueva-Ibanez, J. Mugnier

Research output: Contribution to journalConference article

32 Citations (Scopus)

Abstract

Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

Original languageEnglish
Pages (from-to)1471-1479
Number of pages9
JournalOptical Materials
Volume27
Issue number9
DOIs
Publication statusPublished - 2005 Jan 1
EventProceedings of the Third International Conference on Sol-Gel Materials: Research, Technology, Applications SGM '04 -
Duration: 2004 Jun 62004 Jun 11

Fingerprint

sol-gel processes
yttrium-aluminum garnet
Sol-gel process
Thin films
thin films
Annealing
alkoxides
Crystallization kinetics
Polymethyl Methacrylate
Sols
Differential thermal analysis
Refractive index
Acetates
annealing
Spectroscopy
Transmission electron microscopy
X ray diffraction
acetates
thermal analysis
routes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Physical and Theoretical Chemistry
  • Organic Chemistry
  • Inorganic Chemistry
  • Electrical and Electronic Engineering

Cite this

Wu, Yu-chun ; Parola, S. ; Marty, O. ; Villanueva-Ibanez, M. ; Mugnier, J. / Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes. In: Optical Materials. 2005 ; Vol. 27, No. 9. pp. 1471-1479.
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Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes. / Wu, Yu-chun; Parola, S.; Marty, O.; Villanueva-Ibanez, M.; Mugnier, J.

In: Optical Materials, Vol. 27, No. 9, 01.01.2005, p. 1471-1479.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

AU - Wu, Yu-chun

AU - Parola, S.

AU - Marty, O.

AU - Villanueva-Ibanez, M.

AU - Mugnier, J.

PY - 2005/1/1

Y1 - 2005/1/1

N2 - Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

AB - Y3Al5O12 (YAG) thin films are prepared by the sol-gel process using two different synthesis routes: acetate-alkoxide method (YAG-I) and two-alkoxides method (YAG-II). The sols and films elaborations are described. The film behavior is studied by X-ray diffraction (XRD) and conventional transmission electron microscopy (CTEM) for different annealing temperatures. Differential thermal analysis (DTA) measurements are used for crystallization kinetics investigations. The refractive index and thickness of the as-prepared films are analyzed by m-lines spectroscopy (MLS) and their waveguiding properties are characterized. The relationships between structural evolutions and waveguiding properties of YAG thin films are discussed. These results show that the structural and optical performances of the elaborated YAG thin films strongly depend on the starting materials and their associated annealing treatments.

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