Structural study on optical recording materials Ge2Sb2+xTe5 and GeBi2Te4

Shin ichi Shamoto, Noboru Yamada, Toshiyuki Matsunaga, Thomas Proffen

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Crystal structures of optical recording materials Ge2Sb2+xTe5 and GeBi2Te4 have been studied in terms of the fast phase transition mechanism by both real- and reciprocal-space Rietveld analyses of pulsed neutron powder diffraction data. These crystalline phases had large local lattice distortions. In addition, the crystallite size of GeBi2Te4 was very small (about 150 Å). These results suggest that the similarity of entropy between crystalline and amorphous phases plays an important role in terms of the fast phase transition mechanism.

Original languageEnglish
Pages (from-to)574-577
Number of pages4
JournalPhysica B: Condensed Matter
Volume385-386 I
DOIs
Publication statusPublished - 2006 Nov 27

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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