Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy

W. F. Pong, Y. C. Liou, K. H. Chang, M. H. Tsai, H. H. Hseih, Y. K. Chang, P. K. Tseng, J. F. Lee, Y. Liou, J. C.A. Huang

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4 Citations (Scopus)

Abstract

We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40Å)/Cr (tCr) (tCr = 2, 3, 5, 7, and 9Å) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hep structure when the thickness of the Cr layer is decreased down to ∼5Å or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.

Original languageEnglish
Pages (from-to)746-748
Number of pages3
JournalJournal of Synchrotron Radiation
Volume6
Issue number3
DOIs
Publication statusPublished - 1999 May 1

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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