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Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy

  • W. F. Pong
  • , Y. C. Liou
  • , K. H. Chang
  • , M. H. Tsai
  • , H. H. Hseih
  • , Y. K. Chang
  • , P. K. Tseng
  • , J. F. Lee
  • , Y. Liou
  • , J. C.A. Huang

Research output: Contribution to journalArticlepeer-review

Abstract

We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40Å)/Cr (tCr) (tCr = 2, 3, 5, 7, and 9Å) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hep structure when the thickness of the Cr layer is decreased down to ∼5Å or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.

Original languageEnglish
Pages (from-to)746-748
Number of pages3
JournalJournal of Synchrotron Radiation
Volume6
Issue number3
DOIs
Publication statusPublished - 1999 May 1

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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