Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy

S. C. Ray; K. P.Krishna Kumar; H. M. Tsai; J. W. Chiou; C. W. Pao; W. F. Pong; M. H. Tsai; B. H. Wu; C. R. Sheu; C. C. Chen; Franklin C.N. Hong; H. H. Cheng; A. Dalakyan

doi:10.1016/j.tsf.2007.10.020

Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy

S. C. Ray, K. P.Krishna Kumar, H. M. Tsai, J. W. Chiou, C. W. Pao, W. F. Pong, M. H. Tsai, B. H. Wu, C. R. Sheu, C. C. Chen, Franklin C.N. Hong, H. H. Cheng, A. Dalakyan

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

C K-edge X-ray absorption near-edge structure (XANES) and valence-band photoemission spectroscopy (PES) measurements were taken for hydrogenated amorphous carbon films before and after ion beam irradiation. The C K-edge XANES and valence-band PES spectra indicate that irradiation breaks C-C bonds to form C{double bond, long}C bonds and has a similar effect on the electronic structures of the films, irrespective of the hydrogen content. The valence-band PES measurements reveal that ion beam irradiation markedly enhances the density of carbon π states in the vicinity of the Fermi level.

Original language	English
Pages (from-to)	3374-3377
Number of pages	4
Journal	Thin Solid Films
Volume	516
Issue number	10
DOIs	https://doi.org/10.1016/j.tsf.2007.10.020
Publication status	Published - 2008 Mar 31

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2007.10.020

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Ray, S. C., Kumar, K. P. K., Tsai, H. M., Chiou, J. W., Pao, C. W., Pong, W. F., Tsai, M. H., Wu, B. H., Sheu, C. R., Chen, C. C., Hong, F. C. N., Cheng, H. H., & Dalakyan, A. (2008). Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy. Thin Solid Films, 516(10), 3374-3377. https://doi.org/10.1016/j.tsf.2007.10.020

@article{7a10d1fa1c774b82a2baefb4599bac5a,

title = "Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy",

abstract = "C K-edge X-ray absorption near-edge structure (XANES) and valence-band photoemission spectroscopy (PES) measurements were taken for hydrogenated amorphous carbon films before and after ion beam irradiation. The C K-edge XANES and valence-band PES spectra indicate that irradiation breaks C-C bonds to form C{double bond, long}C bonds and has a similar effect on the electronic structures of the films, irrespective of the hydrogen content. The valence-band PES measurements reveal that ion beam irradiation markedly enhances the density of carbon π states in the vicinity of the Fermi level.",

author = "Ray, {S. C.} and Kumar, {K. P.Krishna} and Tsai, {H. M.} and Chiou, {J. W.} and Pao, {C. W.} and Pong, {W. F.} and Tsai, {M. H.} and Wu, {B. H.} and Sheu, {C. R.} and Chen, {C. C.} and Hong, {Franklin C.N.} and Cheng, {H. H.} and A. Dalakyan",

note = "Funding Information: One of the authors (WFP) would like to thank the Taiwan TFT LCD Association and National Science Council of the Republic of China for financially supporting this research under Contract No. A623TT4000 and NSC 94-2112-M032-013.",

year = "2008",

month = mar,

day = "31",

doi = "10.1016/j.tsf.2007.10.020",

language = "English",

volume = "516",

pages = "3374--3377",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "10",

}

TY - JOUR

T1 - Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy

AU - Ray, S. C.

AU - Kumar, K. P.Krishna

AU - Tsai, H. M.

AU - Chiou, J. W.

AU - Pao, C. W.

AU - Pong, W. F.

AU - Tsai, M. H.

AU - Wu, B. H.

AU - Sheu, C. R.

AU - Chen, C. C.

AU - Hong, Franklin C.N.

AU - Cheng, H. H.

AU - Dalakyan, A.

N1 - Funding Information: One of the authors (WFP) would like to thank the Taiwan TFT LCD Association and National Science Council of the Republic of China for financially supporting this research under Contract No. A623TT4000 and NSC 94-2112-M032-013.

PY - 2008/3/31

Y1 - 2008/3/31

N2 - C K-edge X-ray absorption near-edge structure (XANES) and valence-band photoemission spectroscopy (PES) measurements were taken for hydrogenated amorphous carbon films before and after ion beam irradiation. The C K-edge XANES and valence-band PES spectra indicate that irradiation breaks C-C bonds to form C{double bond, long}C bonds and has a similar effect on the electronic structures of the films, irrespective of the hydrogen content. The valence-band PES measurements reveal that ion beam irradiation markedly enhances the density of carbon π states in the vicinity of the Fermi level.

AB - C K-edge X-ray absorption near-edge structure (XANES) and valence-band photoemission spectroscopy (PES) measurements were taken for hydrogenated amorphous carbon films before and after ion beam irradiation. The C K-edge XANES and valence-band PES spectra indicate that irradiation breaks C-C bonds to form C{double bond, long}C bonds and has a similar effect on the electronic structures of the films, irrespective of the hydrogen content. The valence-band PES measurements reveal that ion beam irradiation markedly enhances the density of carbon π states in the vicinity of the Fermi level.

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U2 - 10.1016/j.tsf.2007.10.020

DO - 10.1016/j.tsf.2007.10.020

M3 - Article

AN - SCOPUS:39649104350

SN - 0040-6090

VL - 516

SP - 3374

EP - 3377

JO - Thin Solid Films

JF - Thin Solid Films

IS - 10

ER -

Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy

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