Study of Form Birefringence in Waveguide Devices Using the Semivectorial Beam Propagation Method

Pao Lo Liu; Bing Jin Li

doi:10.1109/68.93260

Study of Form Birefringence in Waveguide Devices Using the Semivectorial Beam Propagation Method

Pao Lo Liu, Bing Jin Li

Department of Electrical Engineering

Research output: Contribution to journal › Article

27 Citations (Scopus)

Abstract

Waveguide devices based on nonbirefringent substrates may still have form birefringence if there exist index discontinuities. We demonstrate that the semivectorial beam propagation method can be used to study the polarization dependence in waveguide devices. We show that the calculated coupling lengths of planar directional couplers match within 3.5% of analytical solutions. We also present results on polarization dependencies of coupling lengths and bending losses of rib waveguide devices.

Original language	English
Pages (from-to)	913-915
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	3
Issue number	10
DOIs	https://doi.org/10.1109/68.93260
Publication status	Published - 1991 Oct

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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Liu, P. L., & Li, B. J. (1991). Study of Form Birefringence in Waveguide Devices Using the Semivectorial Beam Propagation Method. IEEE Photonics Technology Letters, 3(10), 913-915. https://doi.org/10.1109/68.93260

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