Study of nanoindentation using fem atomic model

Yeau Ren Jeng; Chung Ming Tan

Study of nanoindentation using fem atomic model

Department of Biomedical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

Original language	English
Title of host publication	Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004
Pages	1607-1615
Number of pages	9
Edition	PART B
Publication status	Published - 2004 Dec 1
Event	2004 ASME/STLE International Joint Tribology Conference - Long Beach, CA, United States Duration: 2004 Oct 24 → 2004 Oct 27

Publication series

Name	Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004
Number	PART B

Conference

Conference	2004 ASME/STLE International Joint Tribology Conference
Country	United States
City	Long Beach, CA
Period	04-10-24 → 04-10-27

All Science Journal Classification (ASJC) codes

Engineering(all)

Fingerprint Dive into the research topics of 'Study of nanoindentation using fem atomic model'. Together they form a unique fingerprint.

Cite this

@inproceedings{d11896368eb8407a9553513510e93d79,

title = "Study of nanoindentation using fem atomic model",

abstract = "This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.",

author = "Jeng, {Yeau Ren} and Tan, {Chung Ming}",

year = "2004",

month = dec,

day = "1",

language = "English",

isbn = "0791841812",

series = "Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004",

number = "PART B",

pages = "1607--1615",

booktitle = "Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004",

edition = "PART B",

note = "2004 ASME/STLE International Joint Tribology Conference ; Conference date: 24-10-2004 Through 27-10-2004",

}

Jeng, YR & Tan, CM 2004, Study of nanoindentation using fem atomic model. in Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B edn, Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004, no. PART B, pp. 1607-1615, 2004 ASME/STLE International Joint Tribology Conference, Long Beach, CA, United States, 04-10-24.

Study of nanoindentation using fem atomic model. / Jeng, Yeau Ren; Tan, Chung Ming.

Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B. ed. 2004. p. 1607-1615 (Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004; No. PART B).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Study of nanoindentation using fem atomic model

AU - Jeng, Yeau Ren

AU - Tan, Chung Ming

PY - 2004/12/1

Y1 - 2004/12/1

N2 - This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

AB - This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

UR - http://www.scopus.com/inward/record.url?scp=21244484690&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=21244484690&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:21244484690

SN - 0791841812

T3 - Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004

SP - 1607

EP - 1615

BT - Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004

T2 - 2004 ASME/STLE International Joint Tribology Conference

Y2 - 24 October 2004 through 27 October 2004

ER -