Study of the insulating layer and interfaces of MgO-based magnetic tunnel junctions by impedance and capacitance spectra

J. C.A. Huang, C. Y. Hsu, W. H. Chen, Y. H. Lee

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have systematically investigated the complex impedance (CI) and complex capacitance (CC) spectra of MgO-based magnetic tunnel junctions (MTJs) due to successive annealing. The variation of the tunnel magnetoresistance (TMR) ratio due to annealing can be related to the change of interfacial trap states and textured MgO based on the analysis of CI spectra by an equivalent circuit model. The results of CC spectra are also consistent with the analysis of CI and observed TMR ratio variation. The CI and CC techniques are also powerful to characterize the oxide-based MTJs.

Original languageEnglish
Pages (from-to)911-913
Number of pages3
JournalIEEE Transactions on Magnetics
Volume43
Issue number2
DOIs
Publication statusPublished - 2007 Feb 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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