Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

C. H. Lee, K. L. Yu, J. C.A. Huang, G. Felcher

Research output: Contribution to journalConference article

2 Citations (Scopus)


Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.

Original languageEnglish
Pages (from-to)1491-1494
Number of pages4
JournalJournal of Physics and Chemistry of Solids
Issue number8
Publication statusPublished - 1999 Jan 1
EventProceedings of the 1998 7th ISSP International Symposium Frontiers in Neutron Scattering Research (ISSP7) - Tokyo, Jpn
Duration: 1998 Nov 241998 Nov 27


All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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