Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

C. H. Lee, K. L. Yu, Jung-Chun Huang, G. Felcher

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.

Original languageEnglish
Pages (from-to)1491-1494
Number of pages4
JournalJournal of Physics and Chemistry of Solids
Volume60
Issue number8
DOIs
Publication statusPublished - 1999 Jan 1
EventProceedings of the 1998 7th ISSP International Symposium Frontiers in Neutron Scattering Research (ISSP7) - Tokyo, Jpn
Duration: 1998 Nov 241998 Nov 27

Fingerprint

Permalloys (trademark)
Molecular beam epitaxy
Neutrons
roughness
Surface roughness
reflectance
neutrons
X rays
Thin films
Atoms
Aluminum Oxide
Epitaxial films
Buffer layers
thin films
Magnetic moments
Sapphire
x rays
atoms
sapphire
buffers

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

@article{cfe65b3b927542d8b0e7d504b1ec20a2,
title = "Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films",
abstract = "Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.",
author = "Lee, {C. H.} and Yu, {K. L.} and Jung-Chun Huang and G. Felcher",
year = "1999",
month = "1",
day = "1",
doi = "10.1016/S0022-3697(99)00151-1",
language = "English",
volume = "60",
pages = "1491--1494",
journal = "Journal of Physics and Chemistry of Solids",
issn = "0022-3697",
publisher = "Elsevier Limited",
number = "8",

}

Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films. / Lee, C. H.; Yu, K. L.; Huang, Jung-Chun; Felcher, G.

In: Journal of Physics and Chemistry of Solids, Vol. 60, No. 8, 01.01.1999, p. 1491-1494.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

AU - Lee, C. H.

AU - Yu, K. L.

AU - Huang, Jung-Chun

AU - Felcher, G.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.

AB - Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.

UR - http://www.scopus.com/inward/record.url?scp=0032590529&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032590529&partnerID=8YFLogxK

U2 - 10.1016/S0022-3697(99)00151-1

DO - 10.1016/S0022-3697(99)00151-1

M3 - Conference article

AN - SCOPUS:0032590529

VL - 60

SP - 1491

EP - 1494

JO - Journal of Physics and Chemistry of Solids

JF - Journal of Physics and Chemistry of Solids

SN - 0022-3697

IS - 8

ER -