Engineering & Materials Science
Passivation
79%
Atmospheric pressure
73%
Annealing
64%
Aluminum oxide
62%
Thin films
61%
Microwaves
57%
Deposition rates
27%
X ray photoelectron spectroscopy
26%
Film thickness
23%
Energy dispersive spectroscopy
22%
Transmission electron microscopy
22%
Operating costs
21%
Thermal energy
21%
Deposits
21%
Vacuum
19%
Throughput
15%
Chemical analysis
14%
Temperature
8%
Physics & Astronomy
atomic layer epitaxy
67%
passivity
60%
atmospheric pressure
57%
microwaves
43%
annealing
39%
thin films
33%
operating costs
32%
thermal energy
22%
deposits
19%
chemical composition
19%
penetration
17%
film thickness
17%
wafers
16%
traps
16%
transmission electron microscopy
14%
vacuum
13%
performance
9%
temperature
6%
Chemical Compounds
Atomic Layer Epitaxy
75%
Chemical Passivation
66%
Microwave
53%
Annealing
51%
Pressure
37%
Liquid Film
31%
Interface Trap
27%
Point Group C∞V
25%
Trap Density Measurement
24%
Measurement Method
20%
Vacuum
13%
Energy
7%