The effect of surface roughness on magnetoresistance of permalloy ring structure is investigated. Microstructured permalloy rings with surface roughness varying from 4.2 to 21 nm were fabricated using electron beam lithography and a chemical etching process. It is found experimentally that the first and second nucleation fields decrease obviously with the surface roughness increasing, and the field range for the flux-closure state is not associated with surface roughness. The results indicate that surface roughness in permalloy ring structure is an important factor that influences the magnetic behaviors of the ring. This result can provide important information for future designs of ring-shaped magnetic devices.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering