TY - GEN
T1 - Symbiotic Controller Design Using a Memory-Based FSM Model
AU - Kuo, Su Fu
AU - Wu, Cheng Wen
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/8/10
Y1 - 2018/8/10
N2 - The main obstacles in promoting IOT applications are cost and energy consumption constraints of the devices and systems. As a step forward in improving the reliability and reducing the cost and energy consumption of IOT devices and systems, we had proposed previously a high-level model for efficient design-space exploration, which is called the symbiotic system (SS) model. In this work, as an example for SS-based design, we show that it is possible to develop symbiotic controllers that achieve higher reliability, thus longer lifetime and lower cost. The proposed approach target FSM-based controllers that are key components in almost all digital systems. The experimental result for a small traffic light controller shows that the reliability is improved by about 1.75 times, assuming only hard faults. If the system encounters more soft errors, the lifetime can be greatly extended, e.g., for 50% soft errors, the reliability improvement is about 8.4 times.
AB - The main obstacles in promoting IOT applications are cost and energy consumption constraints of the devices and systems. As a step forward in improving the reliability and reducing the cost and energy consumption of IOT devices and systems, we had proposed previously a high-level model for efficient design-space exploration, which is called the symbiotic system (SS) model. In this work, as an example for SS-based design, we show that it is possible to develop symbiotic controllers that achieve higher reliability, thus longer lifetime and lower cost. The proposed approach target FSM-based controllers that are key components in almost all digital systems. The experimental result for a small traffic light controller shows that the reliability is improved by about 1.75 times, assuming only hard faults. If the system encounters more soft errors, the lifetime can be greatly extended, e.g., for 50% soft errors, the reliability improvement is about 8.4 times.
UR - http://www.scopus.com/inward/record.url?scp=85052393524&partnerID=8YFLogxK
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U2 - 10.1109/ISIE.2018.8433783
DO - 10.1109/ISIE.2018.8433783
M3 - Conference contribution
AN - SCOPUS:85052393524
SN - 9781538637050
T3 - IEEE International Symposium on Industrial Electronics
SP - 874
EP - 879
BT - Proceedings - 2018 IEEE 27th International Symposium on Industrial Electronics, ISIE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 27th IEEE International Symposium on Industrial Electronics, ISIE 2018
Y2 - 13 June 2018 through 15 June 2018
ER -