TY - GEN
T1 - Temperature- and intensity-dependent photovoltaic measurements to identify dominant recombination pathways
AU - Brandt, Riley E.
AU - Mangan, Niall M.
AU - Li, Jian V.
AU - Kurchin, Rachel C.
AU - Milakovich, Timothy
AU - Levcenco, Sergiu
AU - Fitzgerald, Eugene A.
AU - Unold, Thomas
AU - Buonassisi, Tonio
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/18
Y1 - 2016/11/18
N2 - In novel photovoltaic absorbers, it is often difficult to assess the root causes of low open-circuit voltages, which may be due to bulk recombination or sub-optimal contacts. In the present work, we discuss the role of temperature- and illumination-dependent device electrical measurements in quantifying and distinguishing these performance losses - in particular, for determining bounds on interface recombination velocities, band alignment, and minority carrier lifetime. We assess the accuracy of this approach by direct comparison to photoelectron spectroscopy. Then, we demonstrate how more computationally intensive model parameter fitting approaches can draw more insights from this broad measurement space. We apply this measurement and modeling approach to high-performance III-V and thin-film chalcogenide devices.
AB - In novel photovoltaic absorbers, it is often difficult to assess the root causes of low open-circuit voltages, which may be due to bulk recombination or sub-optimal contacts. In the present work, we discuss the role of temperature- and illumination-dependent device electrical measurements in quantifying and distinguishing these performance losses - in particular, for determining bounds on interface recombination velocities, band alignment, and minority carrier lifetime. We assess the accuracy of this approach by direct comparison to photoelectron spectroscopy. Then, we demonstrate how more computationally intensive model parameter fitting approaches can draw more insights from this broad measurement space. We apply this measurement and modeling approach to high-performance III-V and thin-film chalcogenide devices.
UR - http://www.scopus.com/inward/record.url?scp=85003723275&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85003723275&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2016.7749978
DO - 10.1109/PVSC.2016.7749978
M3 - Conference contribution
AN - SCOPUS:85003723275
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1997
EP - 2001
BT - 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Y2 - 5 June 2016 through 10 June 2016
ER -