Temperature dependence of electrical characteristics of strained nMOSFETs using stress memorization technique

Po Chin Huang, San Lein Wu, Shoou Jinn Chang, Cheng Wen Kuo, Ching Yao Chang, Yao Tsung Huang, Yao Chin Cheng, Osbert Cheng

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science