Temperature dependence of gate current and breakdown behaviors in an n+-GaAs/p+-InGaP/n--GaAs high-barrier gate field-effect transistor

Kuo Hui Yu, Kun Wei Lin, Chin Chuan Cheng, Wen Lung Chang, Jung Hui Tsai, Shiou Ying Cheng, Wen Chau Liu

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2 Citations (Scopus)

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