Temperature dependent X-ray absorption spectroscopy of the valence transition in EuNi2(Si0.20Ge0.80)2

Kazuya Yamamoto, Koji Horiba, Munetaka Taguchi, Masaharu Matsunami, Nozomu Kamakura, Yasutaka Takata, Ashish Atma Chainani, Kojiro Mimura, Masayuki Shiga, Hirofumi Wada, Yasunori Senba, Haruhiko Ohashi, Shik Shin

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Abstract

We investigate the temperature induced mixed valence transition in EuNi2(Si0.2Ge0.8)2 using Eu 3d-4f X-ray absorption spectroscopy (XAS). The unoccupied 4f states are studied as a function of temperature (27-120 K), across the critical valence temperature, Tv = 80 K. The Eu 3d-4f X-ray absorption spectra show systematic changes of the mixed valency with temperature. The Eu2 + and Eu3 + spectral features match very well with atomic multiplet calculations. The observed non-integral mean valence changes systematically from ∼ 2.70 ± 0.03 (27 K) to ∼ 2.35 ± 0.03 (120 K), consistent with bulk-sensitive measurements.

Original languageEnglish
Pages (from-to)681-682
Number of pages2
JournalPhysica B: Condensed Matter
Volume378-380
Issue numberSPEC. ISS.
DOIs
Publication statusPublished - 2006 May 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Yamamoto, K., Horiba, K., Taguchi, M., Matsunami, M., Kamakura, N., Takata, Y., Chainani, A. A., Mimura, K., Shiga, M., Wada, H., Senba, Y., Ohashi, H., & Shin, S. (2006). Temperature dependent X-ray absorption spectroscopy of the valence transition in EuNi2(Si0.20Ge0.80)2. Physica B: Condensed Matter, 378-380(SPEC. ISS.), 681-682. https://doi.org/10.1016/j.physb.2006.01.507