Abstract
The effect of growth temperature on the formation of uniform self-assembled Ge dots on Si substrates was discussed. It was found that highly uniform Ge dots with height deviation of ±3% were obtained at 600°C. The analysis showed that the discontinuity in characteristic length was in an Arrhenius plot between 600 and 625°C.
Original language | English |
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Pages (from-to) | 2847-2849 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 14 |
DOIs | |
Publication status | Published - 2003 Oct 6 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)