Test and diagnosis algorithm generation and evaluation for MRAM write disturbance fault

Wan Yu Lo, Ching Yi Chen, Chin Lung Su, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memoryfault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis.

Original languageEnglish
Title of host publicationProceedings of the 17th Asian Test Symposium, ATS 2008
Pages417-422
Number of pages6
DOIs
Publication statusPublished - 2008 Dec 1
Event17th Asian Test Symposium, ATS 2008 - Sapporo, Japan
Duration: 2008 Nov 242008 Nov 27

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other17th Asian Test Symposium, ATS 2008
CountryJapan
CitySapporo
Period08-11-2408-11-27

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • Cite this

    Lo, W. Y., Chen, C. Y., Su, C. L., & Wu, C. W. (2008). Test and diagnosis algorithm generation and evaluation for MRAM write disturbance fault. In Proceedings of the 17th Asian Test Symposium, ATS 2008 (pp. 417-422). [4711626] (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2008.29