Test generation for combinational iterative logic arrays

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication3rd International Symposium on IC Design and Manufacturing (ISIC)
Place of PublicationSingapore
Pages223-230
Publication statusPublished - 1989 Sep

Cite this

Wu, C-W. (1989). Test generation for combinational iterative logic arrays. In 3rd International Symposium on IC Design and Manufacturing (ISIC) (pp. 223-230).