| Original language | English |
|---|---|
| Title of host publication | 3rd International Symposium on IC Design and Manufacturing (ISIC) |
| Place of Publication | Singapore |
| Pages | 223-230 |
| Publication status | Published - 1989 Sept |
Test generation for combinational iterative logic arrays
Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution